Authors : Mane R.D., Chikode P.P. and Dongare M.B.
Page Nos : 224-228
Description :
The paper describes the application of double exposure holographic
interferometry (DEHI) to
determine the intrinsic stress developed on the substrate by using D.C. electrodeposition technique.The
effect on the structural and optical properties of lead selenide thin films deposited on stainless steel and
FTO coated glass s
ubstrates have been discussed.The electrodeposition of lead chalcogenides thin films
was systematically carried out to understand electrochemical reactions and to optimize deposition
conditions to achieve high quality lead chalcogenide thin films.The doubl
e exposure holograms were
recorded for PbSe deposited thin films, varying the different exposure times from 10 to 40 sec. The
interference fringes localized on the surface go on increasing as the time increases and the film thickness
also increases. Using
these interference fringes intrinsic stress is determined.
