Authors : R. D Mane, P. P Chikode, B. M. Sargar and M. B. Dongare
Page Nos : 300-303
Description :
Abstract:
The PbS thin films have been deposited by electrode position on stainless steel substrate and (CH3COO) 2 Pb and Na2S2O3 of an aqueous bath. The solutions of different normality were used with complexing agent EDTA. Double Exposure Holographic Interferometry (DEHI) technique is used for studying surface deformation of stainless steel substrate which was exposed for different intervals of time. It is observed that stress changes with concentrations. It is noticed that number of fringes goes on increasing with concentration. This effect is due to increase in thickness of PbS thin films deposited on stainless steel substrate. We have also measured the mass of deposited PbS thin films. These films were characterized and optimized by using optical absorption and X-ray diffraction technique.
Keywords: PbS thin films, electrode position, Holographic interferometry X-ray diffraction, Optical absorption, Microstructure.
